1 2 3 4 5 6

In-Memory Principal Component Analysis by Crosspoint Array of Resistive Switching Memory: A new hardware approach for energy-efficient data analysis in edge computing Mannocci, P.; Baroni, A.; Melacarne, E.; Zambelli, C.; Olivo, P.; Perez, E.; Wenger, C.; Ielmini, D. details >>	IEEE NANOTECHNOLOGY MAGAZINE Vol. 16, No. 2, pp: 4-13, Anno: 2022

An energy-efficient in-memory computing architecture for survival data analysis based on resistive switching memories Baroni, A.; Glukhov, A.; Perez, E.; Wenger, C.; Calore, E.; Schifano, S. F.; Olivo, P.; Ielmini, D.; Zambelli, C. details >>	FRONTIERS IN NEUROSCIENCE Vol. 16, No. 1, pp: 932270-1-932270-16, Anno: 2022

Low Conductance State Drift Characterization and Mitigation in Resistive Switching Memories (RRAM) for Artificial Neural Networks Baroni, A.; Glukhov, A.; Perez, E.; Wenger, C.; Ielmini, D.; Olivo, P.; Zambelli, C. details >>	IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY Vol. 22, No. 3, pp: 340-347, Anno: 2022

Assessing the role of program suspend operation in 3d nand flash based solid state drives Zambelli, C.; Zuolo, L.; Aldarese, A.; Scommegna, S.; Micheloni, R.; Olivo, P. details >>	ELECTRONICS Vol. 10, No. 12, pp: 1394-1-1394-18, Anno: 2021

A scalable bidimensional randomization scheme for tlc 3d nand flash memories Favalli, M.; Zambelli, C.; Marelli, A.; Micheloni, R.; Olivo, P. details >>	MICROMACHINES Vol. 12, No. 7, pp: 759-1-759-14, Anno: 2021

Investigating 3D NAND Flash Read Disturb Reliability with Extreme Value Analysis Zambelli, C.; Crippa, L.; Micheloni, R.; Olivo, P. details >>	IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY Vol. 21, No. 4, pp: 486-493, Anno: 2021

Accurate Program/Verify Schemes of Resistive Switching Memory (RRAM) for In-Memory Neural Network Circuits Milo, V.; Glukhov, A.; Perez, E.; Zambelli, C.; Lepri, N.; Mahadevaiah, M. K.; Quesada, E. P. -B.; Olivo, P.; Wenger, C.; Ielmini, D. details >>	IEEE TRANSACTIONS ON ELECTRON DEVICES Vol. 68, No. 8, pp: 3832-3837, Anno: 2021

Reliability of Logic-in-Memory Circuits in Resistive Memory Arrays Zanotti, T.; Zambelli, C.; Puglisi, F. M.; Milo, V.; Perez, E.; Mahadevaiah, M. K.; Ossorio, O. G.; Wenger, C.; Pavan, P.; Olivo, P.; Ielmini, D. details >>	IEEE TRANSACTIONS ON ELECTRON DEVICES Vol. 67, No. 11, pp: 4611-4615, Anno: 2020

Mitigating self-heating in solid state drives for industrial internet-of-things edge gateways Zambelli, C.; Zuolo, L.; Crippa, L.; Micheloni, R.; Olivo, P. details >>	ELECTRONICS Vol. 9, No. 7, pp: 1179-1-1179-17, Anno: 2020

First Evidence of Temporary Read Errors in TLC 3D-NAND Flash Memories Exiting from an Idle State Zambelli, C.; Micheloni, R.; Scommegna, S.; Olivo, P. details >>	IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY Vol. 8, No. 1, pp: 8956089-99-8956089-104, Anno: 2020

LDPC Soft Decoding with Improved Performance in 1X-2X MLC and TLC NAND Flash-Based Solid State Drives Zuolo, L.; Zambelli, C.; Marelli, A.; Micheloni, R.; Olivo, P. details >>	IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING Vol. 7, No. 3, pp: 507-515, Anno: 2019

Toward Reliable Multi-Level Operation in RRAM Arrays: Improving Post-Algorithm Stability and Assessing Endurance/Data Retention Perez, E.; Zambelli, C.; Mahadevaiah, M. K.; Olivo, P.; Wenger, C. details >>	IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY Vol. 7, No. 1, pp: 740-747, Anno: 2019

Data retention investigation in Al:HfO 2 -based resistive random access memory arrays by using high-Temperature accelerated tests Perez, Eduardo; Mahadevaiah, Mamathamba K.; Zambelli, Cristian; Olivo, Piero; Wenger, Christian details >>	JOURNAL OF VACUUM SCIENCE AND TECHNOLOGY. B, NANOTECHNOLOGY & MICROELECTRONICS Vol. 37, No. 1, pp: 012202-1-012202-5, Anno: 2019

Multilevel HfO2-based RRAM devices for low-power neuromorphic networks Milo, V.; Zambelli, C.; Olivo, P.; Perez, E.; K. Mahadevaiah, M.; G. Ossorio, O.; Wenger, C.; Ielmini, D. details >>	APL MATERIALS Vol. 7, No. 8, pp: 081120-1-081120-10, Anno: 2019

Enabling Computational Storage Through FPGA Neural Network Accelerator for Enterprise SSD Zambelli, C.; Bertaggia, R.; Zuolo, L.; Micheloni, R.; Olivo, P. details >>	IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS. II, EXPRESS BRIEFS Vol. 66, No. 10, pp: 1738-1742, Anno: 2019

Characterization of the interface-driven 1st Reset operation in HfO2-based 1T1R RRAM devices Perez, E.; Mahadevaiah, M. K.; Zambelli, C.; Olivo, P.; Wenger, C. details >>	SOLID-STATE ELECTRONICS Vol. 159, No. 1, pp: 51-56, Anno: 2019

Cell-to-cell Fundamental Variability Limits Investigation in OxRRAM arrays Grossi, Alessandro; Zambelli, Cristian; Olivo, Piero; Nowak, Etienne; Molas, Gabriel; Nodin, Jean Francois; Perniola, Luca details >>	IEEE ELECTRON DEVICE LETTERS Vol. 39, No. 1, pp: 27-30, Anno: 2018

Is Consumer Electronics Redesigning Our Cars?: Challenges of Integrated Technologies for Sensing, Computing, and Storage Pieri, Francesco; Zambelli, Cristian; Nannini, Andrea; Olivo, Piero; Saponara, Sergio details >>	IEEE CONSUMER ELECTRONICS MAGAZINE Vol. 7, No. 5, pp: 8-17, Anno: 2018

Impact of the precursor chemistry and process conditions on the cell-to-cell variability in 1T-1R based HfO2 RRAM devices Grossi, Alessandro; Perez, Eduardo; Zambelli, Cristian; Olivo, Piero; Miranda, Enrique; Roelofs, Robin; Woodruff, Jacob; Raisanen, Petri; Li, Wei; Givens, Michael; Costina, Ioan; Schubert, Markus Andreas; Wenger, Christian details >>	SCIENTIFIC REPORTS Vol. 8, No. 1, pp: 11160 -1-11160 -11, Anno: 2018

Impact of the NAND Flash Power Supply on Solid State Drives Reliability and Performance Zambelli, Cristian; Micheloni, Rino; Crippa, Luca; Zuolo, Lorenzo; Olivo, Piero details >>	IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY Vol. 18, No. 2, pp: 247-255, Anno: 2018